快闪记忆体技术：考虑设计中的应用

Manytimes,choosingaFLASHmemorydeviceis

drivenbywhichmanufacturerhasthecheapestoffer-

ing.Regardlessofitsuseasastand-alonedeviceoras

theprogrammemoryofamicrocontroller,whatisoften

overlookedarethemanykeydesignparameters,orthe

featuresthatthememorymayoffertotheapplication.

Endurance,dataretention,temperature,operatingvolt-

ageandfrequency,andprogrammingtimeallplaysig-

nificantrolesinthereliabilityofthedevice.Selections

basedoncostalonemaybepenny-wisebutdollar-

foolish;theapplicationmaybethecheapestonthe

marketbutitsoverallqualitycannegativelyimpactthe

customer’sperceptionandtherefore,theirfuturepur-

chases.Carefullybalancingthesefactorscanmakethe

differencebetweenanapplicationthat’salongterm

superstaroraonehitwonder.

Thistechnicalbriefwillreviewthebasicoperationof

Non-VolatileMemory(NVM)cellsandthekeyfactorsof

memoryperformancethatshouldbeconsideredinthe

decisionmakingprocess.Wewillusethesefactorsto

showwhyMicrochip’sFLASHtechnologyissucha

strongcontenderintheworldofembeddedcontrol

design.TB072FLASHMemoryTechnology:ConsiderationsforApplicationDesignAuthor:RodgerRicheyProgramanderaseoperationsareprimarilyaccom-plishedbytwomethods.ProgrammingcanuseeitherMicrochipTechnologyInc.ChannelHotElectrons(CHE)orFowler-Nordheimtun-neling(FN).EraseoperationscanuseeitherFNtunnel-INTRODUCTIONingorEmission.CHEusesacombin