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pcim2013_SimulationbasedZthvsmeasurementanditseffectonLifetimeprediction.pdf

上传者: 2020-10-27 03:31:06上传 PDF文件 451.87KB 热度 10次
Simulation and VCE(T)-measurement based Zth are used to calculate the temperature in an IGBT module after short circuit operations. Temperature gradient shows significant difference and only simulation based Zth agrees well with the short circuit test results
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