Microwave.Scattering.And.Emission.Models.For.Users.

This unique resource provides microwave remote sensing professionals with practical scattering and emission data models that represent the interaction between electromagnetic waves and a scene on the Earth surface in the microwave region. The book helps engineers understand and apply these models toDISCLAIMER OF WARRANTYThe technical descriptions, procedures, and computer programs in this bookhave been developed with the greatest of care and they have been useful to theauthor in a broad range of applications; however, they are provided as is, without warranty of any kind. Artech House and the authors of the book titledMicrowave Scattering and Emission Models for Users make no warrantiesexpressed or implied, that the equations, programs, and procedures in this bookor its associated software are free of error, or are consistent with any particularstandard of merchantability, or will meet your requirements for any particularapplication. They should not be relied upon for solving a problem whose incorrect solution couldresult in injury to a person or loss of propertyAny use of theprograms or procedures in such a manner is at the users own risk. The editors,author, and puer disclaim all llability for direct, incidental, or consequentdamages resulting from use of the programs or procedures in this book or theassociated softwareFor a listing of recent titles in the Artech House Remote Sensing Series,turn to the back of this bookMicrowave scattering andEmission models for usersAdrian K fungK.S. ChenARTECHHOUSEBOSTON LONDONartechhouse. comLibrary of Congress Cataloging-in-Publication DataA catalog record for this book is available from the U.S. Library of CongressBritish Library Cataloguing in Publication Dataa catalogue record for this book is available from the British Library.ISBN-13978-1-60807-037-4over aesignIrC 2010 ARTECH HOUSE685 Canton StreetNorwood, MA02062All rights reserved. Printed and bound in the United States of America. No part of this book maybe reproduced or utilized in any form or by any means, electronic or mechanical, including pho-tocopying, recording, or by any information storage and retrieval system, without permission inwriting from the publisher. All terms mentioned in this book that are known to be trademarks orservice marks have been appropriately capitalized. Artech House cannot attest to the accuracy ofthis information. Use of a term in this book should not be regarded as affecting the validity ofany trademark or service mark10987654321To our families, whose support, understanding andencouragement made this work possibleContentsPrefaceXVChapter 1 Introduction to Microwave Scattering and emission modelsfor users1.1 Introduction1.2 Organization3 Model Definitions for Active and Passive sensingChapter 2 The Small Perturbation Surface Backscattering Model2.1 Introduction2.1.1 Shadowing Considerations2.2 Isotropic Exponential Correlation with a GaussianHeight distribution132.2. 1 Theoretical Trends for the exponential correlation142.2.2 Comparison with measurements182.3 Isotropic Gaussian Correlation with a Gaussian Height Distribution 2023. 1 Theoretical Trends for the gaussian correlation202.3.2 Comparison with measurements252. 4 Isotropic x-power Correlation with a Gaussian height distribution 262.4.1 Theoretical trends for the x-Power correlation272.4.2 Comparison with measurements332. 5 ISotropic x-exponential Correlation with a GaussianHeight distribution342.5.1 Theoretical Trends for the x-Exponential Correlation352.5.2 Comparison with measurements382.6 Isotropic exponential-like Correlation with a gaussianHeight distribution402.6. 1 Theoretical Trends for the Exponential-Like Correlation422.6.2 Comparison with measurements432.7 Discussion44References45Chapter 3 The Simplified Integral Equation Surface Backscattering Model473.1 Introduction473.1.1 The Simplified IEM Model483.1.2 Computer Program Organization523.2 Isotropic exponential correlation533.2.1 Theoretical Trends in Like polarized Scattering withExponential correlation543.2.2 Theoretical Trends in Cross-Polarized Scattering withExponential correlation603.2.3 Comparison with measurement623.3 Isotropic Gaussian Correlation3.3.1 Theoretical Trends in Like Polarized Scattering withGaussian Correlation3.3.2 Theoretical Trends in Cross-Polarized Scattering with773.3.3 Comparison with Measurements and Simulations803.4 Isotropic x-Power Correlation3.4.1 Theoretical Trends in like Polarized Scattering withx-Power Correlation923.4.2 Theoretical Trends in Cross-Polarized Scattering withx-Power Correlation1013.4.3 Comparison with Measurements and Simulations1043.5 Isotropic x-Exponential Correlation3.5.1 Theoretical Trends in Like Polarized Scattering withx-Exponential Correlation1173.5.2 Comparison with measurements1283.6 Isotropic exponential-Like Correlation1323.6.1 A Comparison of Spectral contents1343.6.2 Theoretical Trends in like Polarized scattering withExponential-Like Correlation1363.6.3 Comparison with Measurements and Simulations1443.7 Discussion158References159Chapter 4 The IEM-B Surface Backscattering Model4.1 Introduction16l4.2 Isotropic exponential correlation1664.2.1 Theoretical Trends for Like Polarization with Exponential Correlation 1674.2.2 Comparison with measurements1754.3 Isotropic Gaussian Correlation1814.3.1 Theoretical Trends for Like polarization with Gaussian Correlation 1824.3.2 Comparison with Measurements and Simulations1874.4 Isotropic x-Power Correlation2004.4.1 Theoretical Trends for Like polarization with x-Power Correlation 2014.4.2 Comparison with Measurements and simulations2094.5 Isotropic X-Exponential Correlation2224.5.1 Theoretical Trends for x-Exponential Correlation2224.5.2 Comparison with Measurements2324.6 Isotropic Exponential-Like Correlation2354.6. 1 A Comparison of spectral contents2384.6.2 Theoretical Trends for Exponential-Like Correlation2404.6.3 Comparison with Measurements and Simulations2484.7 Illustration of Surface Parameter Selection2574.7.1 Shadowing Effect2574.7.2 Effect of rms Height2594.7.3 Effect of Correlation Length26047. 4 Effect of Dielectric Constant2614.8 Discussion263References264Chapter 5 Backscattering from Multiscale Surfaces2675.1 Introduction2675.2 Backscattering from MultiScale Rough Surfaces2685.2.1 Two-Scale gaussian-Distributed Gaussian -CorrelatedRandom surface2695.2.2 Three-Scale Gaussian-Distributed. Gaussian-CorrelatedRandom surface2765.2. 3 Conclusions on Multiscale Surface2825.3 Anisotropically Rough Surfaces2835.3.1 Anisotropic Exponential correlation2835.3.2 Anisotropic Gaussian Correlation2885.3.3 An Anisotropic p-Exponential Correlation2945.4 Discussion296References297Chapter 6 Bistatic Properties of the IEM-B Surface Scattering Model2996.1 Introduction2996.2 The Bistatic Scattering Coefficients2996. 3 Theoretical Behaviors and Model comparisons3026.3. 1 Theoretical behaviors3026.3.2 Comparisons with the Simplified IeM model3126.4 Comparisons with Bistatic Scattering from Known Surfaces3206.4.1 Surface Slope effects3206.4.2 Coherent Contribution in Azimuthal Scattering3256.4.3 High-Frequency Effects on Modeling3266.4 4 Measurements at EMSL3286.5 Discussion328References330Chapter 7 The Standard Moment Method3317.1 Introduction3317.2 Generation of Digital Surfaces3317.2.1 Surface with an Analytic Correlation Function3327.2.2 Surface with a Digital Correlation Function3337. 3 Two-Dimensional Surface Scattering simulation3347.3.1 Moment Method Formulation for Dielectric Surfaces3347.4 Simulation Parameter Selection for Single-Scale Rough Surfaces3437.4.1 Effective Window Width relative to the gaussian Window3437.4.2 Points Per Wavelength or Correlation Length3457.4.3 Patch Size345